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Scanning Electron Microscope (SEM) without EDS

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Requisition forms

Please download the requisition form, fill it in, sign it, and upload the filled copy with your booking. This requisition form is provided by the USIC office for this instrument.

Download requisition form PDF

Process: submit booking → in-charge approval → pay on the DU fee portal → upload Order ID + receipt → measurement confirmed. See the payment flowchart and user guidelines.

Booking details

Measurement type *

Charges applied

Per sample—

Quantity *

Total cost—

Rates as per the revised USIC user-charges document — external rates include 18% GST. Per-hour instruments: enter the number of hours; per-sample instruments: number of samples.

Upload filled requisition form (PDF) *

Upload the filled & signed copy of the downloaded requisition form. Only genuine PDF files up to 5 MB are accepted.

Payment is mandatory with every booking. Pay the fee at the DU fee portal — fee.du.ac.in → Fee Payment (Miscellaneous) — selecting “USIC Instrumentation Fee” under the Fee dropdown. Then enter the Order ID and upload the fee receipt below — bookings without payment details are not accepted.

Order ID *

Fee receipt (PDF) *

By submitting you accept the USIC user guidelines. Charges are payable in advance and non-refundable.

For any query related to the instrument
Contact: Mr. Naveen Yadav, 9999655688

About this instrument

The JEOL JSM-6610LV is a high-performance scanning electron microscope (SEM) designed to deliver exceptional imaging and analysis capabilities for a wide range of materials. The JSM-6610LV is widely used in material science, life sciences, and industrial applications.

Features & Specifications:

 
1. Electron Gun: Tungsten

Magnification Range: From 30x to 300,000x
1. Resolution:
Secondary Electron (SE) Resolution: 0 nmat 15 kV (high-resolution imaging of fine surface details).
Capable of producing high-resolution images even at low accelerating voltages.
1. Acceleration Voltage:
From 1 kV to 30 kV.
1. Sample Stage:
Motorized Stage: Allows easy sample manipulation with X, Y, and Zmovement capabilities.
1. Detectors:
Secondary Electron Detector (SE): For surface topography imaging at high magnifications.
Optional Energy-Dispersive X-ray Spectroscopy (EDS)detector for elemental analysis and mapping.
1. Software:
JEOL’s SEM Control Softwarefor ease of operation, real-time image display, and automated adjustments.
Advanced software capabilities for image processing, 3D imaging, and analysisof sample morphology and structure.
1. Sample Chamber:
Large sample chamber with generous space for bulkier samples.
Accommodates various sample sizes and shapes with easy loading/unloading.