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High Resolution X-Ray Diffractometer

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Requisition forms

Please download the requisition form, fill it in, sign it, and upload the filled copy with your booking. This requisition form is provided by the USIC office for this instrument.

Download requisition form PDF

Process: submit booking → in-charge approval → pay on the DU fee portal → upload Order ID + receipt → measurement confirmed. See the payment flowchart and user guidelines.

Booking details

Measurement type *

Charges applied

Per sample—

Quantity *

Total cost—

Rates as per the revised USIC user-charges document — external rates include 18% GST. Per-hour instruments: enter the number of hours; per-sample instruments: number of samples.

Upload filled requisition form (PDF) *

Upload the filled & signed copy of the downloaded requisition form. Only genuine PDF files up to 5 MB are accepted.

Payment is mandatory with every booking. Pay the fee at the DU fee portal — fee.du.ac.in → Fee Payment (Miscellaneous) — selecting “USIC Instrumentation Fee” under the Fee dropdown. Then enter the Order ID and upload the fee receipt below — bookings without payment details are not accepted.

Order ID *

Fee receipt (PDF) *

By submitting you accept the USIC user guidelines. Charges are payable in advance and non-refundable.

For any query related to the instrument
Contact: Dr. Anjali (8826067505)

About this instrument

Model: Rigaku SmartLab with Temperature-Dependent Testing Assembly

Applications:

Phase transition studies (in-situ)  
High- and low-temperature material behavior  
Thin film stress/strain analysis  
Texture and orientation studies

Features/Specifications:

Goniometer: θ/θ goniometer with hybrid optics  
Temperature Stage:  
Range: -130 °C to +400 °C  
Controlled atmosphere capability  
X-ray Source: Cu target  
2θ Range: Up to 150° with variable slits  
Detector: D/teX Ultra high-speed 1D detector  
Software: SmartLab Studio II for method development, Rietveld refinement, stress, pole figures, etc.  
Modes Supported: Powder diffraction, thin film analysis, grazing incidence, rocking curves, etc.