High Resolution Transmission Electron Microscope (HRTEM)

Requisition forms
Please download the requisition form, fill it in, sign it, and upload the filled copy with your booking. This requisition form is provided by the USIC office for this instrument.
Process: submit booking β in-charge approval β pay on the DU fee portal β upload Order ID + receipt β measurement confirmed. See the payment flowchart and user guidelines.
About this instrument
| Specification | Ultra high resolution | High resolution | |
| TEM resolution (at 200 kV) | Point resolution Lattice resolution Information limit | 0.19 nm 0.1 nm β¦0.11 nm (with Cold FEG) β¦0.12 nm (with Schottky FEG) | 0.23 nm 0.1 nm β¦0.11 nm (with Cold FEG) β¦0.12 nm (with Schottky FEG) |
Cold Field Emission Gun (CFEG): Provides high brightness and narrow energy spread, enabling high-resolution imaging and precise electron energy loss spectroscopy (EELS) with energy resolution better
than 0.33 eV
Quad-Lens Condenser System: Independently controls the electron beam intensity (spot size) and convergence angle, providing versatility for various imaging and analytical techniques.
| Accelerating voltage | 20 kVο½200 kV (200 kV, 80 kV are selectable as a default. Other accelerating voltages are options.) |