Table Top X-ray Diffractometer

Physical Characterization Facilities

Make: Malvern Panalytical, Aeris,
X-ray source Cu, 300W

For any query related to the instrument,
Contact : Anjali (8826067505)

  • Category Physical Characterization Facilities
  • Availability Available
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Instrument's Description

X-ray Diffraction (XRD) is a high-tech, non-destructive technique for analysing a wide range of materials, including metals, minerals, polymers, catalysts, plastics, pharmaceuticals, thin-film coatings, ceramics, solar cells and semiconductors. Throughout industry and research institutions, XRD has become an indispensable method for materials investigation, characterization and quality control. More specifically, areas of application include qualitative and quantitative phase analysis, crystallography, structure determination, texture and residual stress investigations.

Sample Description
All solid samples in powder form and thin film will be acceptable for XRD.
Price List
For Internal usage Per Hour 80
For Internal usage Per Sample 20
For External (Academics) usage Per Sample 500
For External (Industries) usage Per Sample 1000