High Resolution X-Ray Diffractometer

Physical Characterization Facilities

Make: Bruker, D8 Discover,
X-ray source Cu, 3KW
Sample stage Eulerian cradle with 6 degrees of freedom, Optical system: 2D area detector, scintillation detector,
Powder diffraction, Rocking curve, X-ray reflectometry, grazing incidence diffraction
measurements, and structure refinement.
High temperature attachment RT to 1773 K
Low temperature attachment 77 K to RT
Types of measurement: Powder diffraction; Thin film diffraction; small angle diffraction

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Category Physical Characterization Facilities
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Instrument's Description

X-ray Diffraction (XRD) is a high-tech, non-destructive technique for analysing a wide range of materials, including metals, minerals, polymers, catalysts, plastics, pharmaceuticals, thin-film coatings, ceramics, solar cells and semiconductors. Throughout industry and research institutions, XRD has become an indispensable method for materials investigation, characterization and quality control. More specifically, areas of application include qualitative and quantitative phase analysis, crystallography, structure determination, texture and residual stress investigations. Currently, we use the Bruker D8 X-ray diffractometer which is designed to easily accommodate all X-ray diffraction applications in material research, powder diffraction and high resolution diffraction. All new D8 goniometry are equipped with stepper motors with optical encoder to ensure extremely precise angular values.

Sample Description

All solid samples in powder (1 g.) form and thin film will be acceptable for XRD.

Price List

For Internal usage Per Sample of RT	20
For External (Academics) usage Per Sample of RT	500
For External (Industries) usage Per Sample of RT	1000