High Resolution X-Ray Diffractometer
Make: Rigaku, SmartLab SE, X-ray source Cu, 3KW
Temerature Variation Range: -150 degree C to 400 degree C
Types of measurement: Powder diffraction; Thin film diffraction; small angle diffraction
For any query related to the instrument,
Contact : Anjali (8826067505)
- Category Physical Characterization Facilities
- Availability Available
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Instrument's Description
X-ray Diffraction (XRD) is a high-tech, non-destructive technique for analysing a wide range of materials, including metals, minerals, polymers, catalysts, plastics, pharmaceuticals, thin-film coatings, ceramics, solar cells and semiconductors. Throughout industry and research institutions, XRD has become an indispensable method for materials investigation, characterization and quality control. More specifically, areas of application include qualitative and quantitative phase analysis, crystallography, structure determination, texture and residual stress investigations.
Sample Description
All solid samples in powder (1 g.) form and thin film will be acceptable for XRD.Price List
| For Internal usage Per Hour of RT | 80 |
| For Internal usage Per Hour of Temp Variation | 500 |
| For Internal usage Per Sample | 20 |
| For External (Academics) usage Per Hour of Temp Variation | 750 |
| For External (Academics) usage Per Sample | 500 |
| For External (Industries) usage Per Sample | 1000 |