Field Emission Scanning Electron microscope (FESEM)

Microscope Facilities

- Zeiss GeminiSEM 500 Thermal field emission type
- Acceleration voltage 0.02 – 30kV
- Probe current 3 pA – 20nA
- Magnification 50x – 2,000,000x
- EDS detector
- Angular selective backscattered detector
- In lens secondary electron detector
- Everhart Thornley secondary electron

For any query related to the instrument,
Contact : Mr. Naveen Yadav (9999655688)

Category Microscope Facilities
Availability To be Repaired
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Instrument's Description

The Scanning Electron Microscope (SEM) is a type of electron microscope that images the sample surface by scanning it with high-energy beam of electrons in a raster scan pattern enabling the investigation of conductive and non-conductive materials. It offers nanometer resolution and a high signal to noise ratio in high vacuum. The Amatek EDS consists latest detector enables detection of elements under high resolution.

Sample Description

Because SEM utilizes vacuum conditions and uses electron beam to form an image, special sample preparations is needed as listed below:-
• The sample is mounted on carbon tape that is put on the surface of the stub.
• Approximate size of the sample 1 x 1 cm (max).
• All water must be removed from the samples because the water would vaporize in the vacuum.
• Electrically conductive samples do not require any preparation before being used, however the samples must be completely dry and free from volatile substances.
• Non-conductive samples need to be made conductive by coating the sample (using sputter coater) with a thin layer of conductive material like Au.

Price List

For Internal usage Per Hour	650
For Internal usage Per Sample	160
For External (Academics) usage Per Hour	2000
For External (Industries) usage Per Hour	4000